Efficient eM-Algorithm for One-Shot Device Data Analysis


[Up] [Top]

Documentation for package ‘OneShotEM’ version 0.1.0

Help Pages

AIC.oneshot_em Extract Akaike Information Criterion (AIC)
BIC.oneshot_em Extract Bayesian Information Criterion (BIC)
coef.oneshot_em Extract Model Coefficients
electro_explosive Electro-Explosive Device Accelerated Life Test Data
em_control Control Parameters for EM Algorithms
logLik.oneshot_em Extract Log-Likelihood
oneshot_em Maximum Likelihood Estimation via New eM-Algorithm for One-Shot Device Data
oneshot_fit Unified Wrapper for Fitting One-Shot Device ALT Models
oneshot_residuals Standardized and Generalized Residuals for One-Shot Device EM Fit
oneshot_tm Maximum Likelihood Estimation via Traditional EM-Algorithm for One-Shot Device Data
plot.oneshot_em Diagnostic Plots for One-Shot Device EM Fit
predict.oneshot_em Predict Survival Probability or Mean Time To Failure
print.oneshot_em Print Method for One-Shot Device EM Fit
print.summary.oneshot_em Print Method for Summary of One-Shot Device EM Fit
summary.oneshot_em Summary Method for One-Shot Device EM Fit
vcov.oneshot_em Extract Variance-Covariance Matrix